High Performance SiC MOSFETs for Fault Tolerant Applications

Authors

  • C. Onambele Author
  • A. Mpanda Author
  • F. Giacchetti Author
  • M. Elsied Author

DOI:

https://doi.org/10.24084/repqj15.257

Keywords:

High efficiency, fault-tolerant applications, modular inverter, SiC power MOSFET module, switching characterization

Abstract

Harsh environment applications are characterized by exceptional constraints regarding temperature, volume, fault tolerance, efficiency, etc. As the introduction of power electronics in such systems is constantly growing, research activities are essential to get more knowledge on the capabilities of available technologies for such applications: aerospace and renewable energies. This paper evaluates the performance of a Silicon Carbide (SiC) MOSFET transistor for a multiphase power converter for fault-tolerant applications. Two methods are carried out in this study: first, the model provided by the manufacturer is used in simulation for a fault-tolerant electric drive application, then in the same operating conditions, the power module is characterized and its performance evaluated. Both methods lead to high system efficiency around 97-98% for a 1200V-400A SiC MOSFET transistor module integrated in a 120kW-100A 6-phase modular inverter.

Author Biographies

  • C. Onambele

    Modeling, Information & Systems Lab (MIS) 
    University of Picardie Jules Verne (UPJV) 
    14, quai de la Somme, 80082 Amiens, France

    Graduate School of Electronic and Electrical Engineering (ESIEE-Amiens) 
    14, quai de la Somme, 80082 Amiens, France 

  • A. Mpanda

    Graduate School of Electronic and Electrical Engineering (ESIEE-Amiens) 
    14, quai de la Somme, 80082 Amiens, France 

  • F. Giacchetti

    Modeling, Information & Systems Lab (MIS) 
    University of Picardie Jules Verne (UPJV) 
    14, quai de la Somme, 80082 Amiens, France

  • M. Elsied

    Graduate School of Electronic and Electrical Engineering (ESIEE-Amiens) 
    14, quai de la Somme, 80082 Amiens, France 

Published

2024-01-12

Issue

Section

Articles