Effect of annealing on the physicochemical and optical properties of the APCVD titanium dioxide thin films for photovoltaic applications

Authors

  • D. Hocine Author
  • M. Pasquinelli Author
  • L. Escoubas Author
  • MS. Belkaid Author

DOI:

https://doi.org/10.24084/repqj09.678

Abstract

In this paper, we studied the influence of thermal

annealing on the phase transformation and crystalline structure

of the APCVD titanium dioxide thin films, which in turn

influence the physicochemical properties and the optical

properties of the produced coatings, by means of standard

characterization techniques of Fourier Transform Infrared

(FTIR) Spectroscopy combined with UV-Vis Reflectance

Spectrophotometry. The absorption peaks at 423 cm-1 and 610

cm -1 which increase in intensity with the rise of annealing

temperature, were observed for the produced rutile TiO2 thin

films, by FTIR measurements. The absorption peak at 739 cm-1

due to the vibration of the Ti-O bonds, was also detected for

different annealing temperatures. From UV-Vis Reflectance

spectra measurements, the minimum average reflectance of 8.6

% was achieved on the as-deposited TiO2 thin film having an

optical band gap of 3.29 eV. The optical band gap of the

produced anatase TiO2 thin film was found to decrease from

3.25 eV to 3.20 eV when the annealing temperature increases

from 400°C to 500°C. However, it was estimated to be 3.05 eV

for the rutile TiO2 film, in good agreement with the FTIR

measurements.

Author Biographies

  • D. Hocine

    Aix-Marseille University, Institut Matériaux Microélectronique Nanosciences de Provence –

    IM2NP CNRS UMR 6242

    Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen – Service 231, F-13397 Marseille Cedex 20, France

    dalilahocine@yahoo.fr

    Laboratory of Advanced Technologies of Genie Electrics (LATAGE)

    Mouloud Mammeri University (UMMTO), BP 17 RP 15000, Tizi-Ouzou, Algeria

  • M. Pasquinelli

    Aix-Marseille University, Institut Matériaux Microélectronique Nanosciences de Provence –

    IM2NP CNRS UMR 6242

    Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen – Service 231, F-13397 Marseille Cedex 20,

    France

    marcel.pasquinelli@univ-cezanne.fr

  • L. Escoubas

    Aix-Marseille University, Institut Matériaux Microélectronique Nanosciences de Provence –

    IM2NP CNRS UMR 6242

    Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen – Service 231, F-13397 Marseille Cedex 20,

    France

    ludovic.escoubas@univ-cezanne.fr

  • MS. Belkaid

    Laboratory of Advanced Technologies of Genie Electrics (LATAGE)

    Mouloud Mammeri University (UMMTO), BP 17 RP 15000, Tizi-Ouzou, Algeria

    belkaid_ms@yahoo.fr

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Published

2024-01-17

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Articles